Neutron diffraction can measure the structure of thin films, similar to other complementary techniques such as X-ray reflectivity and ellipsometry. The technique provides valuable information over a wide variety of scientific and technological applications including chemical aggregation, polymer and surfactant adsorption at interfaces, structure of thin film systems, and vertical component distribution in bulk heterojunction solar cells. We have experience using ISIS at the STRC Rutherford Appleton Laboratory near Oxford in UK, and we look forward to use the neutron source in China soon which is currently under construction.
Neutron reflectivity of polymer:fullerene photovoltaic blends processed at diffrent conditions
ISIS View from Sky ISIS View from Inside
(Source: ISIS of STFC Rutherford Appleton Laboratoory, UK)